Probabilistic Labeling Cost for High-Accuracy Multi-view Reconstruction
IEEE Conference on Computer Vision and Pattern Recognition (CVPR'14)
In this paper, we propose a novel labeling cost for multiview reconstruction. Existing approaches use data terms with specific weaknesses that are vulnerable to common challenges, such as low-textured regions or specularities. Our new probabilistic method implicitly discards outliers and can be shown to become more exact the closer we get to the true object surface. Our approach achieves top results among all published methods on the Middlebury DINO SPARSE dataset and also delivers accurate results on several other datasets with widely varying challenges, for which it works in unchanged form.